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Effective-mass model of surface scattering in locally oxidized Si nanowires

机译:局部氧化Si纳米线表面散射的有效质量模型

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We present a simple model to describe the lowest-subbands surface scattering in locally oxidized silicon nanowires grown in the [110] direction. To this end, we employ an atomistically scaled effective mass model projected from a three-dimensional effective mass equation and apply a quantum transport formalism to calculate the conductance for typical potential profiles. Comparison of our results with hole-transport calculations using atomistic models in conjuction with Density Functional Theory (DFT) points to an intra-subband scattering mechanism from a potential well.
机译:我们提出了一种简单的模型来描述在[110]方向上生长的局部氧化硅纳米线中的最低子带表面散射。为此,我们采用了从三维有效质量方程投影的原子缩放有效质量模型,并施加量子传输形式主义来计算典型潜在型材的电导。我们的结果与利用密度泛函理论(DFT)连锁的原子型模型的孔传输计算比较,从潜在井点指向子带内带散射机构。

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