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Fast Synchrotron X-ray Tomography Study of the Rod Packing Structures

机译:杆包装结构的快速同步X射线断层扫描研究

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We present a fast synchrotron X-ray tomography study of the packing structures of rods under tapping. Utilizing the high flux of the X-rays generated from the third-generation synchrotron source, we can complete a tomography scan within several seconds, after which the three-dimensional (3D) packing structure can be obtained for the subsequent structural analysis. Due to the high-energy nature of the X-ray beam, special image processing steps including image phase-retrieval has been implemented. Overall, this study suggests the possibility of acquiring statistically significant static packing structures within a reasonable time scale using high-intensity X-ray sources.
机译:我们提出了一种快速同步X射线断层扫描研究,敲击下杆的填料结构。利用从第三代同步rotron源产生的高通量,我们可以在几秒钟内完成断层摄影扫描,之后可以获得随后的结构分析的三维(3D)包装结构。由于X射线束的高能量性质,已经实现了包括图像相位检索的特殊图像处理步骤。总体而言,该研究表明,使用高强度X射线源在合理的时间尺度内获得统计上显着的静态包装结构的可能性。

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