Surface x-ray diffraction of complex metal oxide surfaces and interfaces - a new era

摘要

The availability of high-brilliance hard x-ray synchrotron radiation and the advent of novel photon counting area detectors have brought surface x-ray diffraction (SXRD) into a new era. It is now possible to record large numbers of structure factors with much improved reliability within reasonable beamtime durations. As a result, structural determination of the surfaces and interfaces of complex crystallographic systems and heterostructures has now become feasible, especially in conjunction with phase-retrieval methods. It is thereby hoped that detailed structural information will shed light on the unusual physical properties of these systems. Complex metal oxide systems investigated at the Materials Science beamline of the Swiss Light Source, including the surface of SrTiO_ ,a3 thne dint eSrfarceT beitOwen L3a,AlO and the structure of YBa_,gw3C237 rSorwTinO oinO3 l,N audnlGd a (OLabS_r)(AelTa)O presented as examples of what is now possible using SXRD.