Resonant Ionization Laser Ion Source (RILIS)With Improved SelectivityAchieved By Ion Pulse CompressionUsing In-Source Time-of-flight Technique

摘要

This paper describes for the first time the improved selectivity of the RILIS madepossible by the time-of-flight (TOF) ion bunch compression. Brief description of thecompression principles and some preliminary experimental results are presented. In the off-lineexperiments short ion peaks of natural Li, Na, K, Tm and Yb are observed as ions leave theRILIS-TOF structure. For Tm the ion peaks of 5 μs half-height duration are detected and 1 peaks for Sn are predicted. In view of the repetition rate of the ISOLDE-RILIS lasers it is hopedthat the selectivity of Sn isotopes production may be improved as much as 100 employing theRILIS with the TOF ion bunch compression and a gating technique.