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Fabrication and performance of InAs/GaSb type-II superlattices Mid-wavelength infrared detectors

机译:INAS / GASB Type-II超晶体中间波长红外探测器的制造和性能

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Infrared photodetectors were widely applied in satellite detection, infrared-guided, infrared early warning and infrared imaging and so on. Currently, InAs/GaSb type-II superlattices (T2SLs) photodetectors have been attracted by their unique band-structure and potential applications. In this paper, the InAs/GaSb T2SLs photodetectors in mid-wavelength infrared (MWIR) spectral range were fabricated with p-i-n structure, and the process parameters were optimized. The multilayer structure was grown on GaSb substrate by Molecular Beam Epitaxy (MBE). The active area of this photodetector was 260μm×260μm, and the sidewall of mesa was protected by SiO_2 layer. The thickness of adsorption layer was 1060 nm. To reserve more incident area and to avoid the damage caused by welding process, the pad of electrodes were designed under the mesa. A annular electrode was designed to shorten the transmission time of carriers to improve the collection efficiently. The cut-off wavelength λc of the detector was 4.2μm@77K, and the dark current density was measured as 1.07×10~(-3) A/cm~2@V_b=-0.1V. The peak of specific blackbody detectivity (D*) was equal to 1.05×10~(10) cmHz~(1/2)/W at zero-bias.
机译:红外光电探测器广泛应用于卫星检测,红外引导,红外预警和红外成像等。目前,INAS / GASB Type-II超图(T2SLS)光电探测器已被其独特的带状结构和潜在应用所吸引。在本文中,用P-I-N结构制造中波长红外(MWIR)光谱范围中的INAS / GASB T2SL光电探测器,并优化了工艺参数。通过分子束外延(MBE)在气体基板上生长多层结构。该光电探测器的有源区为260μm×260μm,MESA的侧壁受到SiO_2层的保护。吸附层的厚度为1060nm。为了储备更多的事件区域并避免由焊接过程引起的损坏,在台面下设计了电极垫。设计环形电极以缩短载体的传输时间,以有效地改善收集。检测器的截止波长λc为4.2μm@77k,测量暗电流密度为1.07×10〜(-3)A/cm〜2 @ v_b= -0.1v。特定黑体探测率(D *)的峰值在零偏压下等于1.05×10〜(10)CMHz〜(1/2)/ W。

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