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On-chip RC measurement and calibration circuit using Wheatstone bridge

机译:使用惠斯通桥的片上RC测量和校准电路

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In this paper an on-chip RC measurement and calibration circuit using a Wheatstone bridge is presented. In the bridge the resistor R is compared with the virtual resistor of a switched capacitor network. By using a Wheatstone bridge as the measurement principle no accurate timing signals or accurate reference voltages are necessary. The realized system tunes the RC product within 1.5percent of the nominal value. The 5 bits digital output of the circuit is used to reduce the spread of critical parameters of analog signal processing blocks like filters, ADCs and DACs. The prototype circuit is part of a large audio and multi-mode baseband test chip for mobile phones. The chip was processed in TSMC's 65 nm CMOS technology and uses both 2.5V and 1.2V supply voltages. The chip area of the RC measurement and calibration circuit is 0.03 mm~(2). Measurement results are given to show the viability of the proposed circuit.
机译:在本文中,提出了一种片上RC测量和使用惠斯通桥的校准电路。在桥梁中,将电阻器R与开关电容网络的虚拟电阻进行比较。通过使用惠斯通电桥作为测量原理,不需要精确的定时信号或准确的参考电压是必要的。实现的系统在标称值的1.5°内调整RC产品。电路的5位数字输出用于减少模拟信号处理块的关键参数的扩展,如过滤器,ADC和DAC。原型电路是用于移动电话的大型音频和多模基带测试芯片的一部分。该芯片在TSMC的65nm CMOS技术中处理,并使用2.5V和1.2V电源电压。 RC测量和校准电路的芯片面积为0.03mm〜(2)。给出了测量结果,以显示所提出的电路的可行性。

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