External Loopback Testing Experiences with High Speed Serial Interfaces

摘要

Data eye margin test used in conjunction with loopback configuration has become a popular Design for Test (DFT) based test method for high speed links. This paper summarizes the DFT circuitry and test methods for supporting high speed serial interfaces (e.g. S-ATA,). The challenges of no-touch test methods in an external loopback environment are discussed. We close with a summary of our manufacturing experiences and directions for future improvement.