SERIAL COMMUNICATION INTERFACE CIRCUIT PERFORMING EXTERNAL LOOPBACK TEST AND ELECTRICAL DEVICE INCLUDING THE SAME

摘要

A serial communication interface circuit according to an exemplary embodiment of the present disclosure includes: a transmitter that converts first parallel data to first serial data and transmits first serial data through an output port; a receiver that receives the second serial data through the input port and converts the second serial data to second parallel data; a test controller that generates at least one test control signal; and a built-in loopback circuit which forms an external loopback path that includes a channel model based on at least one test control signal between the output port and the input port in a test mode. It is possible to test high-speed serial communication interface circuit with improved coverage.