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Testing Techniques for Hardware Security

机译:硬件安全测试技术

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System security has emerged as a premier design requirement. While there has been an enormous body of impressive work on testing integrated circuits (ICs) desiderata such as manufacturing correctness, delay, and power, there is no reported effort to systematically test IC security in hardware. Our goal is to provide an impetus for this line of research and development by introducing techniques and methodology for rigorous testing of physically unclonable functions (PUFs). Recently, PUFs received a great deal of attention as security mechanisms due to their flexibility to form numerous security protocols and intrinsic resiliency against physical and side channels attacks. We study three classes of PUFs properties to design pertinent test methods: (i) predictability, (ii) sensitivity to component accuracy, and (iii) susceptibility to reverse engineering. As our case studies, we analyze two popular PUF structures, linear and feed-forward, and show that their security is not adequate from several points of view. The technical highlights of the paper are the first non-destructive technique for PUF reverse engineering and a new PUF structure that is capable of passing our security tests.
机译:系统安全已成为优质设计要求。虽然在测试集成电路(ICS)Desiderata(如制造正确性,延迟和电源)的巨大令人印象深刻的工作体内,但没有报道努力在硬件中系统地测试IC安全性。我们的目标是通过引入物理不可渗透功能(PUFS)的严格测试技术和方法来提供这种研发的推动力。最近,PUF由于它们的灵活性来形成许多安全协议和内在弹性,而对身体和侧频道攻击的内在弹性有很大的关注。我们研究了三类PUFS属性来设计相关测试方法:(i)预测性,(ii)对元件精度的敏感性,(iii)对逆向工程的敏感性。作为我们的案例研究,我们分析了两种流行的PUF结构,线性和前锋,并表明他们的安全性来自几个观点来。本文的技术亮点是PUF逆向工程的第一种非破坏性技术,以及能够通过安全测试的新型PUF结构。

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