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STRESS-STRAIN BEHAVIOR OF SnAgCu LEADFREE ALLOYS AT HIGH STRAIN RATES TYPICAL OF MECHANICAL SHOCK

机译:典型机械冲击典型高应变率下SnAGCU引领合金的应力 - 应变行为

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Electronic products are subjected to high G-levels during mechanical shock and vibration. Failure-modes include solder-joint failures, pad cratering, chip-cracking, copper trace fracture, and underfill fillet failures. The second-level interconnects may be experience high-strain rates and accrue damage during repetitive exposure to mechanical shock. Industry migration to leadfree solders has resulted in proliferation of a wide variety of solder alloy compositions. Few of the popular tin-silver-copper alloys include Sn1Ag0.5Cu and Sn3Ag0.5Cu. The high strain rate properties of leadfree solder alloys are scarce. Typical material tests systems are not well suited for measurement of high strain rates typical of mechanical shock. Previously, high strain rates techniques such as the Split Hopkinson Pressure Bar (SHPB) can be used for strain rates of 1000 per sec. However, measurement of materials at strain rates of 1-100 per sec which are typical of mechanical shock is difficult to address. In this paper, a new test-technique developed by the authors has been presented for measurement of material constitutive behavior. The instrument enables attaining strain rates in the neighborhood of 1 to 100 per sec. High speed cameras operating at 300,000 fps have been used in conjunction with digital image correlation for the measurement of full-field strain during the test. Constancy of cross-head velocity has been demonstrated during the test from the unloaded state to the specimen failure. Solder alloy constitutive behavior has been measured for SAC105, and SAC305 solders. Constitutive model has been fit to the material data. Samples have been tested at various time under thermal aging at 25°C and 125°C. The constitutive model has been embedded into an explicit finite element framework for the purpose of life-prediction of leadfree interconnects. Test assemblies has been fabricated and tested under JEDEC JESD22-B111 specified condition for mechanical shock. Model predictions have been correlated with experimental data.
机译:电子产品在机械冲击和振动期间受到高G级。失效模式包括焊接接头故障,垫升流量,芯片开裂,铜痕迹骨折和底部填充圆角故障。在重复暴露于机械冲击期间,第二级互连可能经历高应变率和累积损坏。行业迁移到引领士焊料导致各种焊料合金组合物的增殖。很少有流行的锡银 - 铜合金包括SN1AG0.5CU和SN3AG0.5CU。引线焊料合金的高应变率特性是稀缺的。典型的材料测试系统不适合测量机械冲击典型的高应变率。以前,诸如拆分霍普金森压棒(SHPB)的高应变率技术可用于每秒1000的应变率。然而,难以解决每秒1-100的应变率的材料的测量难以解决。本文介绍了作者开发的新测试技术,用于测量材料本构行为。仪器可以通过每秒1到100的附近获得应变速率。以300,000 fps运行的高速摄像机已经结合使用用于测量测试期间全场应变的数字图像相关。在从卸载状态下试验到标本失败的测试期间已经证明了十字速度的恒定。 SAC105和SAC305焊料测量了焊料合金组成型行为。本构模型一直适合材料数据。在25℃和125℃的热老化下在不同时间测试样品。本构模型已经嵌入到明确的有限元框架中,用于引出引线互连的寿命预测。在JEDEC JESD22-B111规定的机械冲击条件下已经制造和测试了测试组件。模型预测与实验数据相关。

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