Growth Pattern of Zinc Oxide Nanorods on Gold Coated Silicon Surfaces

摘要

Nanostructured ZnO nanorods on gold (Au) coated silicon (Si) surfaces were made by solution method immerse technique, using (ZnNO_3)_2/HMTA at 80° C. The seed surfaces of Au were sputter-coated on Si <100> substrates, in which Au thicknesses were affected by current and sputter-coating time. The morphology of the prepared nanostructure was analysed by scanning electron microscope (SEM), and the structural identification of the ZnO nanorods was carried out using X-ray diffraction in the range of 20 between 30° – 60°. The growth intensity of ZnO nanorods on the substrate was found to be consistent from 3 nm to 12 nm of Au, at 15 nm there is a tremendous drop in growth. The resulting (hkl) peaks were found to be lattice planes of (100), (002), (101), (102) and (110). The presence of Au at thickness 3 - 12 nm gave preferential orientation of Zn (100), (002) and (101), though at different intensity.