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Characterisation of Methane Plasma Treated Carbon Surfaces

机译:甲烷等离子体处理碳表面的表征

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Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) was used to investigate the chemical nature of methane plasma treated graphite surfaces. Principle Component Analysis (PCA) was applied to the SIMS data, revealing chemical changes to the surfaces, in particular the extent of hydrogenation. The hydrogen content of the HOPG surface is observed to increase with systematic increases in power of the plasma treatment. These results are supported by Elastic Recoil Detection Analysis (ERDA) measurements that show a similar increase in hydrogen content. Scanning Tunneling Microscopy (STM) measurements provide insight into the morphological changes to the surface caused by the treatment, via investigating plasma-created features that are observed to increase in coverage with the increases in plasma power.
机译:飞行时间二次离子质谱(TOF-SIMS)用于研究甲烷等离子体处理石墨表面的化学性质。原理分量分析(PCA)应用于SIMS数据,揭示了表面的化学变化,特别是氢化程度。观察到跳跃表面的氢含量随着等离子体处理的功率的系统增加而增加。这些结果由弹性反冲检测分析(ERDA)测量来支持,其显示氢含量类似的增加。扫描隧穿显微镜(STM)测量提供了对由治疗引起的表面的形态变化的洞察,通过调查观察到的等离子体产生的特征随着等离子体功率的增加而增加。

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