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Impact factors on the performance of Schottky barrier MOSFETs with asymmetric barrier height at source/drain

机译:源/排水管不对称屏障高度肖特基屏障MOSFET的影响因素

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The performance of the n-channel Schottky barrier MOSFET with asymmetric barrier height at source/drain (A-SBFET) was numerically simulated. The impact factors on the performance are studied. The results suggest the on-state characteristics of the devices are mainly determined by the source-side barrier height (SBH). Increasing SBH or decreasing body thickness can optimize the sub-threshold slope, and decreasing SBH can enhance the on-state current.
机译:数值模拟了在源/漏极(A-SBFET)处具有不对称阻挡高度的N沟道肖特基屏障MOSFET的性能。研究了对性能的影响因素。结果表明设备的导通特性主要由源侧屏障高度(SBH)决定。增加SBH或减少体厚度可以优化副阈值斜率,并且降低SBH可以增强导通电流。

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