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Watermark-Free and Efficient Spray Clean on Hydrophobic Surface with Single-Wafer Technology

机译:用单晶片技术无水印和高效的喷雾清洁疏水表面

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The interaction of spray-based physical clean and hydrophobic surfaces is studied on a single-wafer technology. A model simulating a rolling water marble on a rotating disk describes accurately the footprint of watermarks, Contrary to its oxide, on a silicon surface the adhesion of particles does not depend on the pH value but on the rotation speed. This newly proposed method, based on the simultaneous combination of spray and liquid dispense is then compared to the standard IPA-based process. Despite the non-usage of solvents, the substrates show similar particles level, defectivity and epi-growth quality.
机译:在单晶片技术上研究了喷涂物理清洁和疏水表面的相互作用。模拟旋转盘上的滚动水大理石的模型准确地描述了水印的占地面积,与其氧化物相反,在硅表面上,颗粒的粘附性不依赖于pH值,而是在转速上。然后基于喷雾和液体分配的同时组合的新提出的方法与基于标准的IPA的方法进行比较。尽管溶剂的非使用情况,但基材呈现出类似的颗粒水平,缺陷和外延生长质量。

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