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Watermark-Free and Efficient Spray Clean on Hydrophobic Surface with Single-Wafer Technology

机译:单晶片技术在疏水表面上实现无水印高效喷雾清洁

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The interaction of spray-based physical clean and hydrophobic surfaces is studied on a single-wafer technology. A model simulating a rolling water marble on a rotating disk describes accurately the footprint of watermarks, Contrary to its oxide, on a silicon surface the adhesion of particles does not depend on the pH value but on the rotation speed. This newly proposed method, based on the simultaneous combination of spray and liquid dispense is then compared to the standard IPA-based process. Despite the non-usage of solvents, the substrates show similar particles level, defectivity and epi-growth quality.
机译:基于单晶片技术研究了基于喷雾的物理清洁表面和疏水表面之间的相互作用。在转盘上模拟滚动水大理石的模型可以准确地描述水印的足迹,与它的氧化物相反,在硅表面上颗粒的附着力不取决于pH值,而取决于转速。然后将这种基于喷雾和液体分配同时组合的新方法与基于IPA的标准工艺进行比较。尽管未使用溶剂,但基材仍显示出相似的颗粒水平,缺陷度和外延生长质量。

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