Increasing testability in QCA circuits using a new test method

摘要

Recently testing of Quantum-dot Cellular Automata circuits has attracted a lot of attentions. This paper proposes a novel method for testing QCA circuits. The method is based on circuit partitioning capability and multi-layer feature of QCA circuits. It can be useful for testing large circuits with many inputs. The proposed test method has potential to increase observability and controllability of QCA circuits, and hence it can amplify testability. In addition, it can be an effective method regarding to Built in Self Test (BIST) technique. Some simulations are performed using a QCA circuit layout and functionality checking tool, called QCADesigner.