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Characterization of Cross-Sectional Profile of Resist Pattern Using Grazing-Incidence Small Angle X-Ray Scattering

机译:使用放射性发生小角度X射线散射抗蚀剂图案横截面轮廓的表征

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摘要

Our newly-developed x-ray metrology tool, CD-SAXS, has been demonstrated. Cross-sectional profiles of resist patterns were measured by the instrument. The results obtained by the CD-SAXS were consistent with those obtained by cross-sectional SEM observation. CD-SAXS has a capability for measuring cross-sectional profile nondestructively. Our new x-ray method is very effective in CD metrology on mass production lines.
机译:我们的新开发的X射线计量工具CD-SAXS已经证明。通过仪器测量抗蚀剂图案的横截面轮廓。 CD-SAXS获得的结果与通过横截面SEM观察获得的结果一致。 CD-SAX具有无损测量横截面型材的能力。我们的新X射线法在批量生产线上的CD计量中非常有效。

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