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Novel Use of Application-Specific Integrated Circuits in Quartz-Based Permanent Downhole Gauges Increases Reliability Estimates in High-Temperature Applications

机译:基于石英的永久井下仪表中的应用专用集成电路的新颖使用增加了高温应用中的可靠性估计

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This paper demonstrates the benefits of using application-specific integrated circuits (ASICs) in the design for downhole, quartz-based, pressure and temperature permanent downhole gauges (PDGs). Historically, downhole electronics have been built with general purpose chipsets, whose functions areadapted to suit design needs. In contrast, through integrating and optimizing the necessary functions into a single integrated circuit (IC), ASIC technology enables a chipset to be customized for a particular use. Compared to the previous generation of PDGs, this approach reduces the overall footprint of the gaugeand improvesthe overall gauge performance,especially for reliability performance. Suchimproved reliability performance is validated through the use of the design for reliability (DFR) process, which consists of define, identify, verify, and validate stages. Thecoreof the validate stage is thereliability demonstration test (RDT). The detailed advantages of the novel use of ASIC technology in PDGs are discussed in this paper, with comparison to the previous generation of PDGs. The incorporation of ASIC circuitry enables lower current consumption, which in turn enables deployment of an increased quantity of pressure and temperature PDGs without increasing the system's power budget. The implementation of ASIC technology helps reduce the overall size of the PDGs, with a 67% reduction in length and a 44% reduction in outer diameter (OD), which also enables direct integration to tubing encased conductors (TEC) by means of prewelded and prespooled connections.The RDT results demonstrate that the ASIC-based PDGcan at least triple the operationlifetimecompared to the previous generation of PDGsin high-temperature downhole environments. Overall, the adoption of ASIC technologysignificantly improves the reliability of PDGs, demonstrating a life of 10 years at 175°C with 80% reliability and 60% confidence in accordance with industry recommended practices, andprovides a permanent downhole monitoring system with a deployment of 40 or more gauges for high-pressure/high-temperature (HP/HT) applications.
机译:本文展示了在井下,石英,压力和温度永久性井下仪(PDG)设计中使用应用专用集成电路(ASIC)的优势。从历史上看,井下电子设备已经建成了一般的芯片组,其功能仍然适合设计需求。相比之下,通过将必要的功能集成和优化到单个集成电路(IC)中,ASIC技术使芯片组能够用于特定使用。与前一代PDG相比,这种方法降低了Gaugeand Inscaesthe整体仪表性能的整体占地面积,特别是对于可靠性性能。通过使用可靠性(DFR)过程的设计来验证如此的可靠性性能,该过程包括定义,识别,验证和验证阶段。验证阶段的TheCoreOf是可控性演示测试(RDT)。本文讨论了PDG中新型ASIC技术使用的详细优势,与前一代PDG相比,讨论了PDG。 ASIC电路的掺入能够降低电流消耗,这又能够在不增加系统的电源预算的情况下部署增加的压力和温度PDG。 ASIC技术的实施有助于降低PDG的总体尺寸,长度减小67%,外径减少44%(OD),也可以通过预制的方式直接整合到管道上(TEC)。 PRESPOOLED连接。RDT结果表明基于ASIC的PDGCAN至少三倍TRIPRIFECOMECOMPARED在前一代PDGSIN高温井下环境。总体而言,ASIC技术的采用可显着提高PDG的可靠性,展示了10年的寿命,在175°C下,可靠性80%,符合行业推荐做法的60%的信心,并提供了一个永久井下监测系统,占部署40或高压/高温(HP / HT)应用的更多仪表。

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