Method for embedding and automatically testing functional part of application-specific integrated circuit for detecting reliability in e.g. medical field, involves detecting defects if condensation is different from reference condensation

摘要

The method involves reading (121) a set of binary vectors precalculated and stored in an external memory (13) i.e. flash memory, of an integrated circuit (14). The vectors are injected (21) in chains of registers connected to inputs of combinational logic elements i.e. Field Programmable gates array (FPGA) type logic elements. The logic elements are executed on the test vectors applied to the input. The vectors obtained at the output of the combinational logic elements are extracted (22). Defects are detected if calculated condensation (122) is different from reference condensation. An independent claim is also included for an integrated circuit comprising a functional part.