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Structural Analysis of Electrical Contacts Based on Displacement Energy of Atoms and Its Application to Sheet Contact with Low Contact Load

机译:基于原子位移能量的电触点结构分析及其在低接触载荷的板接触中的应用

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We have proposed a new model of electrical contact from a viewpoint of atomic displacement, and analyzed the equilibrium energy for the contact. Based on the model, a contact load provides the equilibrium energy to form an effective contact area generated by metallic bonds between a contact material and a substrate. The contact consists of two main conducting modes: one is bulk conducting and the other is tunneling mode. According to the two modes, contact resistance is expressed as a power function and an exponential function. To demonstrate the model, we have developed a novel electrical contact structure composed of thin metal films on an elastomer substrate. By employing this contact configuration, the tunneling conducting mode becomes dominant due to a sheet contact instead of a conventional point contact. Moreover, there is no dent due to the sheet contact with low contact load. Highly stable and low contact resistance of <100 mΩ was attained even under such low load of 0.002N. The experimental results are in good agreement with those predicted from the model.
机译:从原子位移的观点出发,我们提出了一种新的电气接触模型,并分析了接触的平衡能量。基于该模型,接触载荷提供平衡能量,以形成由接触材料和基板之间的金属粘合产生的有效接触区域。触点由两个主要的导电模式组成:一个是散装电导,另一个是隧道模式。根据两种模式,接触电阻表示为功率函数和指数函数。为了展示该模型,我们开发了一种新型电接触结构,该新型电接触结构由弹性体基材上的薄金属膜组成。通过采用该接触配置,由于纸张触点而不是传统的点接触,隧穿导电模式变得如主导地位。而且,由于片材接触而没有凹陷,具有低接触载荷。即使在0.002N的低负载下,也达到了高稳定且低接触电阻<100mΩ。实验结果与从模型预测的那些吻合吻合良好。

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