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CeO2-TiO2/SiO2 Anti-Reflecting and UV-Shielding Double-Functional Films Coated on Glass Substrates Using Sol-Gel Method

机译:CeO2-TiO2 / SiO 2使用溶胶 - 凝胶法涂覆在玻璃基板上的抗反射和紫外线双函数薄膜

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CeO2-TiO2/SiO2 double-layered films were coated on glass substrates using sol-gel method. The films, formed using spin-coating process, had two optical properties at the same time, anti-reflection in visible region and ultraviolet rays(UV) shielding. The films could be used as museum windows, commercial high-resolution displays and so on. These films were composed of CeO2 and TiO2 with molar ratio of 50 to 50 in the first layer and silica matrix in the 2nd layer. Furthermore, the 2nd layer was composed of porous silica films, which showed a lower refractive index, reducing the reflectance significantly in visible wavelength region. The reflectance of the films in visible region between 400 ~ 700 nm was lower than 2%, and almost 100% UV was shielded. The surface roughness of the films was observed through an atomic force microscope, a depth composition profile of the double layered film was measured with an X-ray photoelectron spectrometer(XPS).
机译:使用溶胶 - 凝胶法在玻璃基板上涂覆CEO2-TiO2 / SiO 2双层薄膜。使用旋涂工艺形成的薄膜同时具有两个光学性质,在可见区域和紫外线(UV)屏蔽中的抗反射。这部电影可以用作博物馆窗口,商业高分辨率显示等。这些薄膜由CEO2和TiO 2组成,在第二层中的第一层和二氧化硅基质中具有50至50的摩尔比组成。此外,第二层由多孔二氧化硅膜组成,其显示出较低的折射率,在可见波长区域中显着降低了反射率。在400〜700nm之间的可见区域中薄膜的反射率低于2%,屏蔽了几乎100%UV。通过原子力显微镜观察膜的表面粗糙度,用X射线光电子光谱仪(XPS)测量双层膜的深度组成曲线。

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