首页> 外文会议>Conference on Lasers Electro-Optics Quantum Electronics and Laser Science Conference >Large-Angle, Low-Voltage Electro-Optic Beam Scanner by Kerr Effect and Space-Charge-Controlled Electrical Conduction in KTa_(1-x)Nb_xO_3
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Large-Angle, Low-Voltage Electro-Optic Beam Scanner by Kerr Effect and Space-Charge-Controlled Electrical Conduction in KTa_(1-x)Nb_xO_3

机译:通过KERR效果和空间电荷控制的电气传导大角度,低压电光扫描仪在KTA_(1-x)NB_XO_3中

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摘要

An electro-optic beam scanner with an unprecedented performance is demonstrated. Full deflection angle of 14.3° has been achieved by applying only ±250 V to 0.5-mm-thick KTa_(1-x)Nb_xO_3 crystal with an interaction length of 5.0 mm.
机译:对具有前所未有的性能的电光束扫描仪进行说明。通过仅施加±2​​50 V至0.5mm厚的KTA_(1-X)NB_XO_3晶体,实现了14.3°的全偏转角度,相互作用长度为5.0mm。

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