首页> 外文会议>IUTAM Symposium on Elastohydrodynamics and Micro-elastohydrodynamics >SURFACE ROUGHNESS ATTENUATION IN EHL LINE AND POINT CONTACTS UNDER CONDITIONS OF STARVED LUBRICATION
【24h】

SURFACE ROUGHNESS ATTENUATION IN EHL LINE AND POINT CONTACTS UNDER CONDITIONS OF STARVED LUBRICATION

机译:在饥饿润滑条件下,EHL线和点接触中的表面粗糙度衰减

获取原文

摘要

The authors have previously examined the effect of surface roughness in line and point EHL contacts and have shown that it is the ratio of the wavelength to the inlet pressure sweep that determines the degree of roughness attenuation under the contact. Because of this a single curve can be used to determine the attenuation for all contacts. However this work was carried out for fully flooded contacts and many prac tical contacts operate under conditions of starved lubrication. This paper extends the analysis to this type of conjunction.
机译:该作者先前已经检查了线条和点EHL触点中表面粗糙度的影响,并且已经表明是波长与入口压力扫描的比率确定在接触下的粗糙度衰减程度。由于这一条曲线可用于确定所有触点的衰减。然而,这项工作是为了完全泛滥的接触而进行,并且许多PRAC特性接触在饥饿的润滑条件下运行。本文将分析扩展到这种类型的结合。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号