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High-accuracy calibration of photon-counting detectors

机译:光子计数探测器的高精度校准

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摘要

We discuss a practical implementation of a photon-counting detector calibration using correlated photon pairs produced by parametric down-conversion. In this calibration scheme, the detection of a first photon triggers the measurement sequence aimed at detection of a second photon by a detector under test (DUT). We also describe measurements of radiant power with a photon-counting detector, which is important for implementation of a conventional calibration technique based on detector substitution. In the experiment, we obtain a time-delay histogram of DUT detection events consisting of a correlated signal and a background. We present a method for separating the correlated signal from the background signal that appropriately handles complex properties of typical avalanche photodiode (APD) detectors. Also discussed are measurements of relevant APD properties, including count-rate-dependent afterpulsing, delayed (by up to 10 ns) electronic detections and deadtime effects. We show that understanding of these is essential to perform an accurate calibration.
机译:我们讨论使用参数下转换产生的相关光子对的光子计数检测器校准的实际实现。在该校准方案中,第一光子的检测触发旨在通过检测器(DUT)的检测器检测第二光子的测量序列。我们还描述了具有光子计数检测器的辐射功率的测量,这对于基于检测器替换的传统校准技术来说是重要的。在实验中,我们获得由相关信号和背景组成的DUT检测事件的时滞直方图。我们介绍了一种用于将相关信号与适当处理典型雪崩光电二极管(APD)检测器的复杂性质的背景信号分离的方法。还讨论了相关APD属性的测量,包括计数依赖性的后续脉冲,延迟(最多10ns)电子检测和死区效应。我们表明对这些的理解是对执行准确校准至关重要。

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