Extraction of orthogonal incident state of polarization spectra using Mueller matrix approach

摘要

Novel algorithms based upon Mueller matrix terms are presented herein, which allow the recovery of the spectra associated with incident transverse electrical (TE) and transverse magnetic (TM) orthogonal states of polarization. These, in turn, give more insight into polarization-dependent frequency shifts and other performance-related parameters of interest. This elegant patent-pending solution entails little computational efforts and can significantly improved the testing capacity and capabilities of component designers and contract manufacturers.