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Oxygen Reduction at the Pt/Recast-Nafion Film Interface at Different Temperatures and Relative Humidities

机译:在不同温度和相对湿度下Pt / recast-nafion膜界面的氧气减少

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The effects of temperature (20-80°C) and relative humidity (~0-100%) on the oxygen reduction reaction (ORR) on a Nafion-covered platinum ultramicroelectrode were investigated using cyclic voltammetry and chronoamperometry. The cyclic voltammograms exhibited a significant hysteresis between the forward and reverse scans, which increased with either humidity or temperature increases. No hysteresis was observed for the fully hydrated film equilibrated with liquid water. It is postulated that the oxygen transport may be obstructed by water produced by oxygen reduction, which accumulates at the interface due to its hindered diffusion in the partially hydrated films. The charge transfer kinetics of ORR at both clean and oxide-covered platinum were found to slow down with increases in relative humidity. The effect was stronger for the oxide-covered platinum and was correlated with differences in platinum oxide coverage associated with changes in film hydration.
机译:使用循环伏安法和计时法研究温度(20-80℃)和相对湿度(〜0-100%)对Nafion覆盖的铂超微电极的氧还原反应(ORR)。循环伏安图在前向和反向扫描之间表现出显着的滞后,其随着湿度或温度增加而增加。对于用液态水平衡的全水合膜没有观察到滞后。假设氧气转运可以被通过氧还原产生的水阻塞,该氧气减少由于其在部分水合膜中的阻碍扩散而在界面处积聚。发现干净和氧化覆盖的铂的ORR的电荷转移动力学随着相对湿度的增加而放缓。氧化覆盖的铂效果较强,与与薄膜水化变化相关的铂氧化物覆盖的差异相关。

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