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SEM analysis and selenization of Cu-Zn-Sn sequential films produced by evaporation of metals

机译:金属蒸发产生的Cu-Zn-Sn序贯膜的SEM分析与硒化

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The formation of Cu2SnZnSe4 thin films in the selenization of different sequential metallic and alloy films is investigated. It is shown that the main process of low temperature selenization (up to 300°C) is the formation of different binary copper selenides on the layer surface. High temperature selenization (over 400°C) leads to the formation of Cu2ZnSnSe4 phase with some excess of a separate ZnSe phase. The content of ZnSe diminishes with the rise of the selenization temperature, but the selenized films stayed always multiphased. The size of the formed Cu2ZnSnSe4 crystals is controlled by the composition of the precursor.
机译:研究了Cu 2 SNZNSE 4 薄膜在不同顺序金属和合金薄膜的硒化中的薄膜。结果表明,低温硒化(高达300℃)的主要方法是在层表面上形成不同二元铜硒化烷基。高温硒化(超过400°C)导致Cu 2 ZNSNSE 4 相的形成,其具有多余的单独ZnSe相。 ZnSE的含量随着硒化温度的升高而减小,但硒化薄膜总是始终多相。由前体的组成控制所形成的Cu 2 ZnSNSE 4 晶体的尺寸。

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