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DC and AC Symmetry Tests for MOSFET Models

机译:用于MOSFET模型的DC和AC对称性测试

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摘要

Symmetry around V_(ds) = 0 is a critical requirement for MOSFET models, e.g. as it affects the ability of a model to simulate distortion accurately for some RF CMOS mixers. The Gummel symmetry test has been the standard test used to evaluate the symmetry of MOSFET models. However, this test is only applicable to DC current, and is only valid when there is negligible gate or substrate current. This paper presents a DC symmetry test that is applicable in the presence of gate and substrate currents, and an AC symmetry test that is simple and effective in verifying symmetry of C_(gs) and C_(gd).
机译:v_(ds)= 0周围的对称是MOSFET模型的关键要求,例如,由于它影响模型为一些RF CMOS混合器精确模拟失真的能力。 Gummel对称测试是用于评估MOSFET模型对称性的标准测试。然而,该测试仅适用于DC电流,并且当栅极或基板电流可忽略不计的时,才有效。本文介绍了在栅极和基板电流存在下适用的直流对称试验,以及在验证C_(GS)和C_(GD)的对称性方面简单且有效的AC对称测试。

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