Oxide composite perpendicular media has been shown to produce fine grains that are decoupled by oxide at the grain boundaries, leading to low noise performance in disk drive media [1-2]. However, a large increase in oxide content in order to decouple the grains can result in an increasing tendency to form precipitations within the magnetic grains on a fine scale, rather than segregating completely to grain boundaries. In this study, we address some consideration of oxide mobility in two types of oxide composite perpendicular media A (CoCrPt-SiO{sub}2) and B (FePt-MgO). Specifically, we examine the effects of bias sputtering on the morphology of the deposited composite film.
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