首页> 外文会议>International Workshop on Advances in Signal Processing for Non Destructive Evaluation of Materials >Inversion of microscopic lock-in thermograms in the presence of emissivity contrast
【24h】

Inversion of microscopic lock-in thermograms in the presence of emissivity contrast

机译:在发射率对比度的情况下,微观锁定热量点的反演

获取原文

摘要

None of the conventionally displayed images of lock-in thermography (in-phase or 0° image, out of phase or -90° image, amplitude image, phase image) is able to become inverted in the presence of emissivity contrast. The phase signal is inherently emissivity-corrected, but here contributions of different heat sources superimpose very nonlinearly, which prevents any meaningful deconvolution. It is shown that the "0°/-90°" image, as an alternative kind of representation of lock-in thermography images, being also inherently emissivity-corrected, is able to be inverted for obtaining e.g. the lateral power distribution in an electronic device. Blackening the surface by colloidal bismuth also may remove the emissivity contrast.
机译:锁定热处理(相位或0°图像,超相距或-90°图像,幅度图像,相位图像)没有一个传统上显示的图像能够在发射率对比度的存在下反转。相位信号本质上是发射率校正,但这里不同的热源的贡献非常非线性地叠加,这防止了任何有意义的折折叠。结果表明,“0°/ -90°”图像,作为锁定热法摄影图像的替代类型,也是固有的发射率校正,能够被反转以获得例如e。电子设备中的横向配电。通过胶体铋的表面变黑也可以消除发射率对比度。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号