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TOWARDS A TRACEABLE INFRASTRUCTURE FOR LOW FORCE MEASUREMENTS

机译:朝着低力测量的可追踪基础设施

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Over the past ten years or so the need for the measurement of low forces ranging from newtons down to attonewtons has become increasingly important. As we begin to manufacture and manipulate structures on the micrometre to nanometre scale, the forces that are exerted in such processes must be controlled. To control such forces requires some form of measurement, either a direct measurement of the force, or a measurement of the effect the force has on the structure it is applied to. This paper is primarily concerned with the development of a traceability infrastructure for forces in the range from 1 nN to 10 μN. The lower end of this force range does not cover chemical or most biological forces (usually in the femto- to piconewton range) despite the increasing importance of accurately measuring such forces. Further work is still required to push the limits of force traceability to these levels. At the upper end of the force range considered here, more traditional methods for measuring forces can be used that are traceable to the unit of mass, i.e. the force is realised as a mass in a gravitational field. The force range discussed in this paper applies to many nano- and micrometre scale manipulation and assembly applications, including micro-grippers, handlers and force feedback devices. Further applications that fall into the force range discussed here include the force exerted on a surface by atomic force microscopes and other scanning probe instruments, forces in the area of materials property measurement using indentation technology, the forces found in micro-electromechnical systems (MEMS) and the forces exerted by artificial biological tissues, for example muscle fibres. The two main force generation mechanisms that are found in nature and engineering are the weight of the mass of an object in a gravitational field and the deflection of an element with a finite spring constant. On the micro- to nanometre scale the spring force is more usually used to produce or react to a force, for example an AFM cantilever.
机译:在过去的十年左右,需要测量低力的纽约州向下到Adtonewtons越来越重要。当我们开始在微米到纳米级上制造和操纵结构时,必须控制在这些过程中施加的力。为了控制这种力需要某种形式的测量,直接测量力,或者力的测量力对其应用于其的结构。本文主要涉及开发可追溯性基础设施的力,其力范围为1 nn至10μN。尽管准确测量这种力量的重要性越来越重要,但该力范围的下端不会覆盖化学或大多数生物力(通常在Femto-to Piconewton系列中)。仍然需要进一步的工作来推动力量可追溯性的限制。在此考虑的力范围的上端,可以使用可追溯到质量单位的更传统的测量力的方法,即,该力被实现为引力场中的质量。本文讨论的力范围适用于许多纳米和微米尺度操纵和组装应用,包括微夹具,处理器和力反馈设备。落入此处讨论的力范围的进一步应用包括通过原子力显微镜和其他扫描探针仪器施加在表面上的力,使用压痕技术的材料性能测量领域的力,在微电器系统(MEMS)中的力量并且由人工生物组织施加的力,例如肌肉纤维。在自然和工程中发现的两个主要力产生机制是引力场中物体质量的重量和具有有限弹簧常数的元件的偏转。在微到纳米垢上,弹簧力更通常用于生产或反应力,例如AFM悬臂。

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