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TOWARDS A TRACEABLE INFRASTRUCTURE FOR LOW FORCE MEASUREMENTS

机译:迈向可跟踪的基础设施,实现低压力测量

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Over the past ten years or so the need for the measurement of low forces ranging from newtons down to attonewtons has become increasingly important. As we begin to manufacture and manipulate structures on the micrometre to nanometre scale, the forces that are exerted in such processes must be controlled. To control such forces requires some form of measurement, either a direct measurement of the force, or a measurement of the effect the force has on the structure it is applied to. This paper is primarily concerned with the development of a traceability infrastructure for forces in the range from 1 nN to 10 μN. The lower end of this force range does not cover chemical or most biological forces (usually in the femto- to piconewton range) despite the increasing importance of accurately measuring such forces. Further work is still required to push the limits of force traceability to these levels. At the upper end of the force range considered here, more traditional methods for measuring forces can be used that are traceable to the unit of mass, i.e. the force is realised as a mass in a gravitational field. The force range discussed in this paper applies to many nano- and micrometre scale manipulation and assembly applications, including micro-grippers, handlers and force feedback devices. Further applications that fall into the force range discussed here include the force exerted on a surface by atomic force microscopes and other scanning probe instruments, forces in the area of materials property measurement using indentation technology, the forces found in micro-electromechnical systems (MEMS) and the forces exerted by artificial biological tissues, for example muscle fibres. The two main force generation mechanisms that are found in nature and engineering are the weight of the mass of an object in a gravitational field and the deflection of an element with a finite spring constant. On the micro- to nanometre scale the spring force is more usually used to produce or react to a force, for example an AFM cantilever.
机译:在过去的十年左右的时间里,测量从牛顿到大牛顿的低压力的需求变得越来越重要。随着我们开始制造和操纵微米级至纳米级的结构,必须控制在此类过程中施加的力。为了控制这种力,需要某种形式的测量,或者直接测量力,或者测量力对其所施加的结构的影响。本文主要涉及可追溯力基础结构的开发,该基础结构的作用力范围为1 nN至10μN。尽管精确测量此类作用力的重要性日益提高,但该作用力范围的下限并不涵盖化学作用力或大多数生物作用力(通常在毫微微至皮克顿范围内)。仍需要进一步的工作,以将力溯源的极限推到这些水平。在此处考虑的力范围的上限,可以使用更传统的测量力的方法,该方法可追溯到质量单位,即,力在重力场中实现为质量。本文讨论的力范围适用于许多纳米和微米尺度的操纵和组装应用,包括微型夹具,操纵器和力反馈装置。属于此处讨论的力范围的其他应用包括原子力显微镜和其他扫描探针仪器施加在表面上的力,使用压痕技术测量材料性能领域中的力,微机电系统(MEMS)中的力以及人工生物组织(例如肌肉纤维)施加的力。在自然界和工程界中发现的两个主要的力产生机理是物体在重力场中的重量和具有有限弹簧常数的元件的挠度。在微米到纳米尺度上,弹簧力通常用于产生力或对力产生反应,例如AFM悬臂。

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