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Application of Procrustes Distance to Shape Analysis of Delaunay Simplexes

机译:Procrustes距离在Delaunay Simplexes的形状分析中的应用

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The concept of Procrustes distance is applied to the shape analysis of the Delaunay simplexes. Procrustes distance provides a measure of coincidence of two point sets {x{sub}i} and {y{sub}i}, i=1..N. For this purpose the variance of point deviations is calculated at the optimal superposition of the sets. It allows to characterize the shape proximity of a given simplex to shape of a reference one, e.g. to the shape of the regular tetrahedron. This approach differs from the method used in physics, where the variations of edge lengths are calculated in order to characterize the simplex shape. We compare both methods on an example of structure analysis of dense packings of hard spheres. The method of Procrustes distance reproduces known structural results; however, it allows to distinguish more details because it deals with simplex vertices, which define the simplex uniquely, in contrast to simplex edges.
机译:Procrustes距离的概念应用于Delaunay单纯x的形状分析。 Procrustes距离提供了两点集的易磁度{x {sub} i}和{y {sub} i},i = 1..n。为此目的,点偏差的方差在该组的最佳叠加下计算。它允许表征给定简单x的形状接近,例如参考的形状,例如,常规四面体的形状。这种方法与物理学中使用的方法不同,其中计算边缘长度的变化以表征单纯形状。我们对两种封闭填料结构分析的例子进行了比较。径期距离的方法再现已知的结构结果;但是,它允许区分更多细节,因为它涉及单纯x顶点,它与单纯x边缘相比,它唯一地定义了单纯形。

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