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The Contact Resistance and Arc Erosion Behavior of Separable C_P-Nb-Cr/Cu-Cd Electrical Contact Material

机译:可分离C_P-NB-Cr / Cu-CD电接触材料的接触电阻和电弧腐蚀行为

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C_P-Nb-Cr/Cu-Cd electrical contact material, which contains 1.7wt.% of Cd, 0.5wt.% of C_P (man-made diamond particles), 2.0 wt.% of Nb and 0.7 wt.% of Cr, was fabricated by powder metallurgy process. The contact material was installed in different ac contactors covering current range from 40 to 630A. While tested under AC-4 electrical load, the electrical contact material was worn out gradually by repeated electrical arc, and microstructure of the arc-affected surface layer changed dramatically. Mechanism of arc erosion process and contact resistance fluctuation was discussed by corresponding microstructure observation and chemical composition analysis of the surface layer. C_P-Nb-Cr/Cu-Cd electrical contact material is capable to be used in 63~250A ac contactors under AC-4 working conditions.
机译:C_P-NB-Cr / Cu-CD电接触材料,含有1.7wt。的Cd%,0.5wt%。占C_P(人造金刚石颗粒)的%,2.0重量%。Nb和0.7重量%的。由粉末冶金工艺制造。接触材料安装在不同的AC接触器中,覆盖电流范围为40至630A。在AC-4电负载下测试时,通过重复的电弧逐渐磨损电接触材料,并且电弧受影响的表面层的微观结构急剧变化。通过相应的微观结构观察和表面层的化学成分分析讨论了电弧侵蚀过程和接触电阻波动的机理。 C_P-NB-CR / CU-CD电接触材料能够在AC-4工作条件下在63〜250A个AC接触器中使用。

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