Absorption and Irradiated Area Factors in X-Ray Stress Measurement

摘要

The equations for calculating the absorption factor (A factor) in the fixed-ψ and -ψ{sub}0 methods using the iso-inclination method and the fixed -η and -η{sub}0 methods using the side-inclination method were derived. In the fixed-ψ and -η methods, the x-ray irradiation in a restricted fixed area at every ψ angles will affects the diffracted intensity as a function of a diffraction angle and therefore it affects the peak position. To correct this effect, the irradiated area (IA) factor was proposed. The effect of the correction for the LPA and IA factors increases as a diffraction line broadens.