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Swift Heavy Ion Irradiated Planar Waveguides in a Rare Earth Doped Tungsten Tellurite Glass and a Tungstate Crystal

机译:Swift重离子照射平面波导在稀土掺杂钨酿酒池和钨酸盐晶体中

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摘要

Planar optical waveguides were designed and fabricated in an Er-doped Tungsten- Tellurite oxide glass and in a KDy (WO_4)_2 crystal by swift heavy ion irradiation. 12.5 MeV Au~(5+) ions were used in the first case and 10.5 MeV N~(4+) ions in the second one. Irradiated fluences were very low: 7?10~(14) ions/cm~2 in the first experiment, and 4?10~(15) ions/cm~2 ions/cm~2 in the second one. Micro Raman studies of both waveguides showed structural changes in the irradiated samples. Ellipsometric measurements showed the existence of ion beam irradiated thin film structures in both samples. M-line spectroscopic measurements were carried out to check functionality of the ion beam irradiated planar optical waveguides. One guided mode was detected in both samples at the wavelength of 632.8 nm both in TE and TM modes. However, amplitude and width of the detected m-lines indicate high propagation losses. According to our previous experiences, stepwise thermal annealing can largely reduce propagation losses, and even allow for guiding at the 1550 nm telecom band.
机译:通过SWIFT重离子照射在ER掺杂的钨碲酸盐玻璃和kDy(WO_4)_2晶体中设计和制造平面光波导。在第一种情况下使用12.5MeV Au〜(5+)离子,第二个案例和10.5mev n〜(4+)离子中使用。辐照的流动率非常低:第一个实验中的7?10〜(14)离子/ cm〜2,在第二个试验中4?10〜(15)离子/ cm〜2离子/ cm〜2。双波导的微拉曼研究显示出辐照样品的结构变化。椭圆测量测量显示在两个样品中存在离子束照射的薄膜结构。进行M线光谱测量以检查离子束照射平面光波导的功能。在TE和TM模式下,在632.8nm波长的两个样品中检测一个引导模式。然而,检测到的M线的幅度和宽度表示高传播损耗。根据我们以前的经验,逐步的热退火可以大大降低传播损耗,甚至允许在1550nm电信频段引导。

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