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Frequency domain-based extraction method of one-port device's non-linear state functions from large-signal measurements

机译:基于频域的一个端口设备的非线性状态函数的提取方法来自大信号测量

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A novel frequency domain-based method for the extraction of one-port device's non-linear constitutive relations directly from vector large-signal measurements is presented. A distinctive characteristic of the method is that it provides directly the charge-voltage state-function, without the need to perform the integration of the capacitance-voltage function as required by its time domain-based counterpart. The capabilities of the method are demonstrated by extracting the non-linear state-functions of a microwave diode from large-signal data generated by harmonic balance analysis, and the non-linear gate-source state-functions of a HEMT device under 'cold-FET' bias conditions from measured data.
机译:提出了一种基于频域的基于频域的用于提取单端口设备的非线性本构关系的方法,直接从向量大信号测量结果进行。该方法的独特特征在于它提供直接充电电压状态功能,而无需根据其基于时域的对应物的要求执行电容电压函数的集成。通过从由谐波平衡分析产生的大信号数据提取微波二极管的非线性状态函数和“冷”下的HEMT设备的非线性栅极源状态功能来证明该方法的能力。 FET'偏置来自测量数据的条件。

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