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Frequency domain-based extraction method of one-port device’s non-linear state functions from large-signal measurements

机译:大信号测量中基于频域的单端口设备非线性状态函数提取方法

摘要

A novel frequency domain-based method for the extraction of one-port device’s non-linear constitutive relations directly from vector large-signal measurements is presented. A distinctive characteristic of the method is that it provides directly the charge-voltage state-function, without the need to perform the integration of the capacitance-voltage function as required by its time domain-based counterpart. The capabilities of the method are demonstrated by extracting the non-linear state-functions of a microwave diode from large-signal data generated by harmonic balance analysis, and the non-linear gate-source state-functions of a HEMT device under ‘cold-FET’ bias conditions from measured data.
机译:提出了一种基于频域的新颖方法,可直接从矢量大信号测量中提取单端口设备的非线性本构关系。该方法的一个显着特征是,它可以直接提供电荷-电压状态函数,而无需根据其基于时域的对应项进行电容-电压函数的积分。通过从谐波平衡分析生成的大信号数据中提取微波二极管的非线性状态函数以及“冷态”下HEMT器件的非线性栅极-源极状态函数,可以证明该方法的功能。 FET的偏置条件来自测量数据。

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