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A statistical analysis of interpolation errors in precision electronic thermometer calibrations: lessons from 263 calibrations at NMI

机译:精密电子温度计校准中插值误差的统计分析:NMI校准的课程

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Precision electronic thermometers are now commonly used as reference standards for calibration laboratories and other precision applications. These devices can often perform better than the manufacturer's specifications, however the industrial-grade PRT sensors, particularly if used over a wide temperature range, are often inadequately modelled by the interpolation equations available to the instrument. The estimated interpolation error of the calibrated thermometers is dependent on the number of calibration points used, and since most calibration laboratories perform calibrations manually, there is a trade-off between uncertainty and cost. This paper considers 263 calibrations performed by NMI on high-precision electronic thermometers. At NMI calibrations are performed at a large number of temperatures, with a calibration-system uncertainty of 3 mK (5 mK above 250 deg C). We can thus examine the interpolation error introduced by calibration at coarser temperature intervals. We find that use of 20 deg C intervals below 0 deg C and 50 deg C intervals above 0 deg C is sufficient to achieve interpolation errors of below 5 mK in most common precision electronic thermometers.
机译:精密电子温度计现在常用为校准实验室和其他精密应用的参考标准。这些设备通常比制造商的规格更好,但是工业级PRT传感器,特别是如果在宽温度范围内使用,则通常由仪器的插值方程不充分建模。校准温度计的估计插值误差取决于所使用的校准点数,并且由于大多数校准实验室手动执行校准,因此在不确定度和成本之间存在权衡。本文考虑了NMI在高精度电子温度计上进行了263次校准。在NMI校准下在大量温度下进行,校准系统不确定度为3 mk(50×250℃以上)。因此,我们可以在较粗糙的温度间隔中检查通过校准引入的插值误差。我们发现,在0℃下使用20°C间隔和0°以上的50°C间隔足以在最常见的精密电子温度计中实现低于5 mk的内插误差。

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