A full automatic device to detect heavy metal Hg, Fe, Cr elements based on thin-film sensitive material prepared on the surface of light-addressable potentiometric sensor (LAPS) by means of pulsed laser deposition (PLD) technique is developed. High-purity chemical compound AgI:Ag2S:HgI synthesized were as target of PLD, thin film sensitive to Hg~2+ ion was prepared on the surface of LAPS. All-state chalcogenide glass ion selective electrodes (ISE), Fe-ISE and Cr-ISE, were also respectively as targets of PLD and thin films on different LAPS sensitive to Fe~3+ and Cr~6+ ions were prepared. The heavy metal analysis device with characteristics of collect sample in-site, real-time determination, communication and multifunction software are designed. Hardware design of the device mainly includes control and measurement aspects. The determination limits of Hg, Fe, Cr ions are respectively 3.44× 10'7 mol/L, 6.31×lO"6 mol/L and 2.09×l0'7 mol/L.
展开▼
