Handheld total reflection X-ray fluorescence spectrometer with 10~(-10) g detection limits

摘要

The total reflection X-ray fluorescence (TXRF) analysis is now a well established method for detecting and quantifying trace elements and was first proposed by Yoneda and Horiuchi in 1971. Figure 1 shows a schematic view of the TXRF analysis. By using this method, multi elements in a specimen can be analyzed simultaneously in air. Volume of a sample solution needed for a measurement is generally microliters.