【24h】

OPTIMISED PREAMPLIFIER FOR LF-NOISE MOSFET CHARACTERIZATION

机译:用于LF噪声MOSFET表征的优化前置放大器

获取原文

摘要

A modular design of preamplifier for low frequency noise measurements with interchangeable first stage was chosen to improve reliability and to reduce the influence of connection cables on measurement results. In this communication we present the optimised preamplifier modules as the first stages for MOSFETs gate leakage and drain current noise measurements with input impedance 50 Ω-10~8 Ω in the frequency range 1.0 Hz-10~5 Hz. The best available commercial operational amplifiers (OPA's) AD549, OPA637 and LT1028A were used for the first stage module at each of the three chosen impedance ranges. The noise characteristics of different OPA's, which have been tested, are also presented.
机译:选择具有可互换第一阶段的低频噪声测量的前置放大器的模块化设计,以提高可靠性,并降低连接电缆对测量结果的影响。在该通信中,我们将优化的前置放大器模块呈现为MOSFET栅极泄漏的第一级,并在频率范围内输入阻抗的输入阻抗漏极电流噪声测量值1.0 Hz-10〜5 Hz。最佳可用的商业运​​算放大器(OPA)AD549,OPA637和LT1028A用于第一级模块,每个三个所选阻抗范围。还介绍了已经测试的不同OPA的噪声特性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号