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RADIOFREQUENCY AND MICROWAVE NOISE METROLOGY

机译:射频和微波噪声计量

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摘要

The radiofrequency interferometer, as compared to other methods for the measurement of amplitude noise and phase noise, shows higher sensitivity. In fa-vorble onditions the background noise can be as low as ―180 dB[rad~2]/Hz at f = 1 Hz off the carrier, up to microwaves (10 GHz) for real-time measurements. Exploiting correlation and averaging, a white noise floor of —204 dB[rad~2]/Hz has been observed, not limited by the thermal energy k_BT_0 referred to the carroer power P_0. This article reports on the method, on the recent developments, and on the measurement of low-noise hard-to-measure devices.
机译:与其他用于测量幅度噪声和相位噪声的方法相比,射频干涉仪显示出更高的灵敏度。在FA-Vorble onditions中,背景噪声可以低至-180dB [Rad〜2] / Hz,关闭载波,直到微波(10GHz),用于实时测量。利用相关性和平均值,已经观察到-204dB [Rad〜2] / Hz的白色噪声底板,不受所提到的摩洛尔功率P_0的热能K_BT_0的限制。本文报告了该方法,最近的发展,以及低噪声硬质量设备的测量。

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