INFORMATIVE 'PASSPORT DATA' OF SURFACE NANO- AND MICROSTRUCTURES

摘要

A general phenomenological approach -Flicker Noise Spectroscopy (FNS)-for revelation of information valuable parameters characterizing the arbitrary chaotic surfaces was developed to distinguish their patterns and describe quantitatively their functional properties. The method developed was applied to revelation of effects of a shungit filling agent in polypropylen matrix on the composite properties, revelation of hydrogen treatment effects on the cleavage surfaces of LiF monocrystals after their dissolution in water with quantitative evaluations of their anisotropy, analysis of activity of vacuum deposited porphyrins layers in a photosensibilized generation of singlet oxygen into gaseous phase. The approach elaborated can be used for developing the new control tools for processing scanning probe microscopy (SPM) data in nanotechnologies, microelectronics, production of polymeric materials with specific surface properties, and others.