1-to 10-keV x-ray backlighting of annular wire arrays on the Sandia Z-machine using bent-crystal imaging techniques

摘要

Annular wire array implosions on the Sandia Z-machine can produce >200 TW and 1-2 MJ of soft x rays in the 0.1-10 keV range. The x-ray flux and debris in this environment present significant challenges for radiographic diagnostics. X-ray backlighting diagnostics at 1865 and 6181 eV using spherically-bent crystals have been fielded on the Z-machine, each with a ～0.6 eV spectral bandpass, 10 μm spatial resolution, and a 4 mm by 20 mm field of view. The Z-Beamlet laser, a 2-TW, 2-kJ Nd:glass laser (λ=527 nm), is used to produce 0.1-1 J x-ray sources for radiography. The design, calibration, and performance of these diagnostics is presented.