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EUV lithography development in Europe: present status and perspectives

机译:EUV欧洲光刻开发:现状和观点

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摘要

According to the ISMT roadmap, Extreme Ultraviolet lithography (EUVL) is the most promising technology to reach the 45-nm node for industrial production and to satisfy the famous law of Moore beyond 2007. Already in 1998 the first European EUVL project (EUCLIDES) has been launched under the leadership of ASM Lithography. Shortly after that in 1999, the national R&D program PREUVE started in France to improve EUVL related technologies and to build the first experimental lithography bench (BEL) in Europe. Finally, in 2001, the main European industrial companies as well as academic and national laboratories have federated within the important MEDEA+ effort to overcome the main technological challenges and to industrialize EUVL in time. Indeed, one of the most important challenges of EUVL concerns the achievement of very powerful, clean and reliable sources. The present paper will give the current state of European EUVL source technology and an overview of the different approaches. Main results are reviewed and the remaining challenges are discussed.
机译:根据ISMT路线图,极端紫外线(EUVL)是最有希望的技术达到45纳米节点的工业生产,并满足于2007年以后的着名摩尔的法律。1998年,第一个欧洲EUVL项目(EUCLIDES)已经存在在ASM光刻的领导下发布了。在1999年之后不久,国家研发计划初中始于法国,以改善EUVL相关技术,并在欧洲建造第一个实验性光刻长凳(BEL)。最后,2001年,主要欧洲工业公司以及学术和国家实验室联合在重要的地雷+努力中,以克服主要技术挑战并及时发展euvl。实际上,EUVL最重要的挑战之一涉及实现非常强大,干净,可靠的来源。本文将提供当前欧洲EUVL源技术的现状及不同方法的概述。经过审查主要结果,讨论了剩余的挑战。

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