Analysis of grating profiles of phase holograms recorded in silver halide emulsions and processed with combinations of various developers and bleaching agents

摘要

A large number of plane-wave holograms were recorded in Agfa-Gevaert 8E75HD holographic plates, at a wide range of bias exposures and fringe visibilities. The plates were processed by various combinations of developers (AAC, Pyrogallol and Catechol) and bleaching agents (R-9 and EDTA). The phase gratings were studied by phase-contrast microscopy, using a high-power immersion (100 X) objective. The phase contrast photomicrographs were Fourier-analyzed. Thus first- second- and third-order modulation of the refractive index as a function of the bias exposure and the visibility of the recording interference pattern could be determined. The ratio of the amplitudes of the higher-order modulations to that of the first-order one can serve as a measure of the nonlinearity of the holographic recording.