The characterization of nanocrystalline V_2O_5 and mixed V_2O_5/Ce oxide

摘要

Thin films of vanadium oxide and new, mixed V/Ce oxide thin films with 55 and 38 atom % of V were prepared on glass substrates covered with SnO_2:F (K-glass) The influence of the added cerium precursors as well as the influence of the substrate material on the formation of the films were studied in order to connect their improved intercalation properties for Li ions. The structural properties and the morphologies of the films were determined with transmission electron microscopy and grazing-incidence small-angle X-ray scattering. Transmission electron microscopy revealed the crystalline structure, with the formation of V_2O_5 (orthorhombic structure) in all the films. The average grain radius, obtained by grazing-incidence small-angle X-ray scattering was correlated with the layer thickness.