A MIP model for IC final testing order selection problem

摘要

In order to confront the volitile market cycle in the semiconductor industry, IC final testing companies have adopted a lag strategy in recently years. As a result, when the market is in the upturn, the firms may have insufficient capacity, and a selection of candidate orders is necessary. This research proposes a mixed integer programming model to solve the IC final test order selection problem (ICFTOSP). With the objective of maximizing a firm's profit, the model takes into account the characteristics of limited capacity of testers, different profit for different orders and sequence dependent setup time. A real-world example is given to show the usability of the proposed model.