On Two Problems of w-Wide Distance and (w-1)-Fault Distance, w-Wide Diameter and (w-1)-Fault Diameter

摘要

Wide diameter and fault diameter is a newly introduced parameter to measure the reliability and fault tolerance of networks and VLSI [1]. This paper gives the results of two open problems offered by D. Frank Hsu in [2] which are about w-Wide Distance And (w-1)-Fault Distance, w-Wide Diameter And (w-1)-Fault Diameter, and gives a constructional method to solve those two problems.